Scanning Nonlinear Dielectric Microscopy
  • Release Date : 20 May 2020
  • Publisher : Woodhead Publishing
  • Categories : Technology & Engineering
  • Pages : 256 pages
  • ISBN 13 : 9780081028032
  • ISBN 10 : 0081028032
Score: 4
From 245 Ratings
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Synopsis : Scanning Nonlinear Dielectric Microscopy written by Yasuo Cho, published by Woodhead Publishing which was released on 20 May 2020. Download Scanning Nonlinear Dielectric Microscopy Books now! Available in PDF, EPUB, Mobi Format. Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

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Author : Rainer Waser,Ulrich Böttger,Stephan Tiedke
Publisher : John Wiley & Sons
Category : Technology & Engineering
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