Reliability Prediction from Burn In Data Fit to Reliability Models
  • Release Date : 06 March 2014
  • Publisher : Academic Press
  • Categories : Technology & Engineering
  • Pages : 108 pages
  • ISBN 13 : 9780128008195
  • ISBN 10 : 0128008199
Score: 4
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Synopsis : Reliability Prediction from Burn In Data Fit to Reliability Models written by Joseph Bernstein, published by Academic Press which was released on 06 March 2014. Download Reliability Prediction from Burn In Data Fit to Reliability Models Books now! Available in PDF, EPUB, Mobi Format. This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. The ability to include reliability calculations and test results in their product design The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions Have accurate failure rate calculations for calculating warrantee period replacement costs

Reliability

Reliability

Author : Wallace R. Blischke,D. N. Prabhakar Murthy
Publisher : John Wiley & Sons
Category : Technology & Engineering
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