Atom Probe Tomography
  • Release Date : 30 May 2016
  • Publisher : Academic Press
  • Categories : Technology & Engineering
  • Pages : 416 pages
  • ISBN 13 : 9780128047453
  • ISBN 10 : 0128047453
Score: 4
From 245 Ratings
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Synopsis : Atom Probe Tomography written by Williams Lefebvre, published by Academic Press which was released on 30 May 2016. Download Atom Probe Tomography Books now! Available in PDF, EPUB, Mobi Format. Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Atom Probe Tomography

Atom Probe Tomography

Author : Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
Publisher : Academic Press
Category : Technology & Engineering
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Atom Probe Microscopy

Atom Probe Microscopy

Author : Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
Publisher : Springer Science & Business Media
Category : Technology & Engineering
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Atom Probe Field Ion Microscopy

Atom Probe Field Ion Microscopy

Author : Michael Kenneth Miller,A. Cerezo,M. G. Hetherington,G. D. W. Smith
Publisher : Oxford University Press on Demand
Category : Biography & Autobiography
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