Fundamental Principles of Engineering Nanometrology
  • Release Date : 17 May 2014
  • Publisher : Elsevier
  • Categories : Science
  • Pages : 384 pages
  • ISBN 13 : 9781455777501
  • ISBN 10 : 1455777501
Score: 4
From 245 Ratings
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Synopsis : Fundamental Principles of Engineering Nanometrology written by Richard Leach, published by Elsevier which was released on 17 May 2014. Download Fundamental Principles of Engineering Nanometrology Books now! Available in PDF, EPUB, Mobi Format. Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty Fully updated to cover the latest technological developments, standards, and regulations

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Author : David J. Whitehouse,Shin Gijutsu Kaihatsu Jigyōdan (Japan). Exploratory Research for Advanced Technology
Publisher : Taylor & Francis
Category : Technology & Engineering
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